scanning electron microscopy sem device Search Results


90
Integrated Graphene ultrafast scanning electron microscope (sem) based on the optical fiber-integrated graphene ultrafast hot-electron source
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Ultrafast Scanning Electron Microscope (Sem) Based On The Optical Fiber Integrated Graphene Ultrafast Hot Electron Source, supplied by Integrated Graphene, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
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Raith GmbH field emission gun scanning electron microscope leo 1530
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Field Emission Gun Scanning Electron Microscope Leo 1530, supplied by Raith GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/field+emission+gun+scanning+electron+microscope+leo+1530/pm19546492-29-7-22
Average 90 stars, based on 1 article reviews
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90
NanoLab Inc helios nanolab 650 sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Helios Nanolab 650 Sem, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/focused+ion+beam/pmc11827638__sciadv__ads0790_sm-122-4-19
Average 90 stars, based on 1 article reviews
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90
SIRION Biotech scanning electron microscope fei sirion 400nc
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Fei Sirion 400nc, supplied by SIRION Biotech, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/scanning+electron+microscope+fei+sirion+200/10__1016_slash_j__wear__2013__12__007-63-23-23
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90
TESCAN ORSAY scanning electron microscope tescan vega 3
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Tescan Vega 3, supplied by TESCAN ORSAY, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/mira+3+lmu+scanning+electron+microscope/pm34361274-66-12-19
Average 90 stars, based on 1 article reviews
scanning electron microscope tescan vega 3 - by Bioz Stars, 2026-10
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Raith America Inc raith 150 field emission scanning electron microscope (sem)
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Raith 150 Field Emission Scanning Electron Microscope (Sem), supplied by Raith America Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/field+emission+scanning+electron+microscope+raith+150/pm28347122-102-1-9
Average 90 stars, based on 1 article reviews
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99
Hitachi Ltd scanning electron microscopy sem images
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscopy Sem Images, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/SU8600/pm35542742-53-0-13
Average 99 stars, based on 1 article reviews
scanning electron microscopy sem images - by Bioz Stars, 2026-10
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Hitachi Ltd scanning electron microscopy sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscopy Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/TM4000/pm39410174-99-13-20
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96
Hitachi Ltd scanning electron microscope sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/FlexSEM+1000+II/pm39404332-97-11-18
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Hitachi Ltd scanning electron microscopy
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscopy, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/SU5000/pm34736029-67-17-21
Average 99 stars, based on 1 article reviews
scanning electron microscopy - by Bioz Stars, 2026-10
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Hitachi Ltd scanning electron microscope
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/SU9000/pm19621950__ja903869y_si_001-14-0-4
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90
KEYENCE sem ve-9800
The conceptual design, fabrication, and micropatterns characteristics in the microfluidic devices. ( A ) An illustration of the stepwise design and fabrication of 3D-PMMD showing the micropattern topography. ( B ) (Top) Bright-field images of micropatterns at different printing deposition heights of 100 µm (MP1), 200 µm (MP2), and 400 µm (MP4), (Bottom) Box plot showing the actual layers deposition height measurements in the microfluidic post-3D printing; box limits indicate the 25th and 75th percentiles; Scale bar of 200 µm. ( C ) (Top) Bright-field images of the PDMS stamps cross-section of micropatterns at different printing deposition heights of 200 µm (MP2), 300 µm (MP3), and 400 µm (MP4), (Bottom) Box plot showing the heights and widths of the micropatterns according to the PDMS stamps; box limits indicate the 25th and 75th percentiles. ( D ) Scanning electron <t>microscopy</t> <t>(SEM)</t> images of micropatterns at different printing deposition heights of 100 µm (MP1), 200 µm (MP2), and 400 µm (MP4). Illustration icons were created with BioRender.com under the academic licensing right in s (access on 11 October 2021).
Sem Ve 9800, supplied by KEYENCE, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscopy+sem+device/scanning+electron+microscope+ve+8800/pmc08788470-33-0-14
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sem ve-9800 - by Bioz Stars, 2026-10
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Image Search Results


a Schematic diagram of our ultrafast SEM. A traditional scanning microscope body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.

Journal: Nature Communications

Article Title: Stable ultrafast graphene hot-electron source on optical fiber

doi: 10.1038/s41467-025-60915-x

Figure Lengend Snippet: a Schematic diagram of our ultrafast SEM. A traditional scanning microscope body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.

Article Snippet: Fig. 4 Ultrafast scanning electron microscope (SEM) based on the optical fiber-integrated graphene ultrafast hot-electron source. a Schematic diagram of our ultrafast SEM.

Techniques: Microscopy, Imaging

The conceptual design, fabrication, and micropatterns characteristics in the microfluidic devices. ( A ) An illustration of the stepwise design and fabrication of 3D-PMMD showing the micropattern topography. ( B ) (Top) Bright-field images of micropatterns at different printing deposition heights of 100 µm (MP1), 200 µm (MP2), and 400 µm (MP4), (Bottom) Box plot showing the actual layers deposition height measurements in the microfluidic post-3D printing; box limits indicate the 25th and 75th percentiles; Scale bar of 200 µm. ( C ) (Top) Bright-field images of the PDMS stamps cross-section of micropatterns at different printing deposition heights of 200 µm (MP2), 300 µm (MP3), and 400 µm (MP4), (Bottom) Box plot showing the heights and widths of the micropatterns according to the PDMS stamps; box limits indicate the 25th and 75th percentiles. ( D ) Scanning electron microscopy (SEM) images of micropatterns at different printing deposition heights of 100 µm (MP1), 200 µm (MP2), and 400 µm (MP4). Illustration icons were created with BioRender.com under the academic licensing right in s (access on 11 October 2021).

Journal: Biomimetics

Article Title: The Development of Biomimetic Aligned Skeletal Muscles in a Fully 3D Printed Microfluidic Device

doi: 10.3390/biomimetics7010002

Figure Lengend Snippet: The conceptual design, fabrication, and micropatterns characteristics in the microfluidic devices. ( A ) An illustration of the stepwise design and fabrication of 3D-PMMD showing the micropattern topography. ( B ) (Top) Bright-field images of micropatterns at different printing deposition heights of 100 µm (MP1), 200 µm (MP2), and 400 µm (MP4), (Bottom) Box plot showing the actual layers deposition height measurements in the microfluidic post-3D printing; box limits indicate the 25th and 75th percentiles; Scale bar of 200 µm. ( C ) (Top) Bright-field images of the PDMS stamps cross-section of micropatterns at different printing deposition heights of 200 µm (MP2), 300 µm (MP3), and 400 µm (MP4), (Bottom) Box plot showing the heights and widths of the micropatterns according to the PDMS stamps; box limits indicate the 25th and 75th percentiles. ( D ) Scanning electron microscopy (SEM) images of micropatterns at different printing deposition heights of 100 µm (MP1), 200 µm (MP2), and 400 µm (MP4). Illustration icons were created with BioRender.com under the academic licensing right in s (access on 11 October 2021).

Article Snippet: Scanning electron microscopy (SEM) analysis of the micropattern in the devices was performed using KEYENCE (VE-9800, Tokyo, Japan).

Techniques: Electron Microscopy